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[Start: Texas Instruments XDS2xx USB Debug Probe_0]
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Execute the command:
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%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -S integrity
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[Result]
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-----[Print the board config pathname(s)]------------------------------------
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/home/<usr>/.ti/<usr>/0/0/BrdDat/testBoard.dat
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-----[Print the reset-command software log-file]-----------------------------
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This utility has selected a 560/2xx-class product.
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This utility will load the program 'xds2xxu.out'.
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The library build date was 'Sep 26 2024'.
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The library build time was '14:57:19'.
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The library package version is '20.0.0.3178'.
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The library component version is '35.35.0.0'.
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The controller does not use a programmable FPGA.
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The controller has a version number of '13' (0x0000000d).
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The controller has an insertion length of '0' (0x00000000).
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This utility will attempt to reset the controller.
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This utility has successfully reset the controller.
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-----[Print the reset-command hardware log-file]-----------------------------
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This emulator does not create a reset log-file.
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-----[Perform the Integrity scan-test on the JTAG IR]------------------------
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This test will use blocks of 64 32-bit words.
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This test will be applied just once.
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Do a test using 0xFFFFFFFF.
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Scan tests: 1, skipped: 0, failed: 0
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Do a test using 0x00000000.
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Scan tests: 2, skipped: 0, failed: 0
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Do a test using 0xFE03E0E2.
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Scan tests: 3, skipped: 0, failed: 0
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Do a test using 0x01FC1F1D.
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Scan tests: 4, skipped: 0, failed: 0
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Do a test using 0x5533CCAA.
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Scan tests: 5, skipped: 0, failed: 0
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Do a test using 0xAACC3355.
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Scan tests: 6, skipped: 0, failed: 0
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All of the values were scanned correctly.
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The JTAG IR Integrity scan-test has succeeded.
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-----[Perform the Integrity scan-test on the JTAG DR]------------------------
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This test will use blocks of 64 32-bit words.
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This test will be applied just once.
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Do a test using 0xFFFFFFFF.
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Scan tests: 1, skipped: 0, failed: 0
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Do a test using 0x00000000.
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Scan tests: 2, skipped: 0, failed: 0
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Do a test using 0xFE03E0E2.
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Scan tests: 3, skipped: 0, failed: 0
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Do a test using 0x01FC1F1D.
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Scan tests: 4, skipped: 0, failed: 0
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Do a test using 0x5533CCAA.
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Scan tests: 5, skipped: 0, failed: 0
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Do a test using 0xAACC3355.
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Scan tests: 6, skipped: 0, failed: 0
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All of the values were scanned correctly.
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The JTAG DR Integrity scan-test has succeeded.
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[End: Texas Instruments XDS2xx USB Debug Probe_0]
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