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1
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[Start: Texas Instruments XDS2xx USB Debug Probe_0]
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2
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3
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Execute the command:
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4
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5
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%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -S integrity
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6
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7
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[Result]
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8
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9
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10
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-----[Print the board config pathname(s)]------------------------------------
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11
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12
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C:\Users\jcormier\AppData\Local\TEXASI~1\
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13
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CCS\ccs1010\0\0\BrdDat\testBoard.dat
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14
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15
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-----[Print the reset-command software log-file]-----------------------------
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16
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17
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This utility has selected a 560/2xx-class product.
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18
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This utility will load the program 'xds2xxu.out'.
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19
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The library build date was 'May 7 2020'.
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20
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The library build time was '20:23:44'.
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21
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The library package version is '9.2.0.00002'.
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22
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The library component version is '35.35.0.0'.
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23
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The controller does not use a programmable FPGA.
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24
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The controller has a version number of '13' (0x0000000d).
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25
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The controller has an insertion length of '0' (0x00000000).
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26
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This utility will attempt to reset the controller.
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27
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This utility has successfully reset the controller.
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28
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29
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-----[Print the reset-command hardware log-file]-----------------------------
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30
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31
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This emulator does not create a reset log-file.
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32
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33
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-----[Perform the Integrity scan-test on the JTAG IR]------------------------
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34
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35
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This test will use blocks of 64 32-bit words.
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36
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This test will be applied just once.
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37
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38
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Do a test using 0xFFFFFFFF.
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39
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Scan tests: 1, skipped: 0, failed: 0
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40
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Do a test using 0x00000000.
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41
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Scan tests: 2, skipped: 0, failed: 0
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42
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Do a test using 0xFE03E0E2.
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43
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Scan tests: 3, skipped: 0, failed: 0
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44
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Do a test using 0x01FC1F1D.
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45
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Scan tests: 4, skipped: 0, failed: 0
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46
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Do a test using 0x5533CCAA.
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47
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Scan tests: 5, skipped: 0, failed: 0
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48
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Do a test using 0xAACC3355.
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49
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Scan tests: 6, skipped: 0, failed: 0
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50
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All of the values were scanned correctly.
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51
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52
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The JTAG IR Integrity scan-test has succeeded.
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53
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54
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-----[Perform the Integrity scan-test on the JTAG DR]------------------------
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55
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56
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This test will use blocks of 64 32-bit words.
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57
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This test will be applied just once.
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58
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59
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Do a test using 0xFFFFFFFF.
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60
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Scan tests: 1, skipped: 0, failed: 0
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61
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Do a test using 0x00000000.
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62
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Scan tests: 2, skipped: 0, failed: 0
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63
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Do a test using 0xFE03E0E2.
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64
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Scan tests: 3, skipped: 0, failed: 0
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65
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Do a test using 0x01FC1F1D.
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66
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Scan tests: 4, skipped: 0, failed: 0
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67
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Do a test using 0x5533CCAA.
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68
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Scan tests: 5, skipped: 0, failed: 0
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69
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Do a test using 0xAACC3355.
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70
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Scan tests: 6, skipped: 0, failed: 0
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71
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All of the values were scanned correctly.
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72
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73
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The JTAG DR Integrity scan-test has succeeded.
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74
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75
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[End: Texas Instruments XDS2xx USB Debug Probe_0]
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